Characterization of memories

Characterization of memory blocks is carried out in the following conditions:

maximal speed (high-speed models, maximal power supply, minimal temperature, extraction with minimal parasitic parameters)
typical speed (typical models, typical power supply, typical temperature, extraction with typical parasitic parameters)
minimal speed (low-speed models, minimal power supply, maximal temperature, extraction with maximal parasitic parameters)

Characterized parameters of RAM memories

access time
clock cycle time
the high clock time
the low clock time
output data switching time
setup time of the address signal relative to the clock
hold time of the address signal relative to clock
setup time of the data relative to clock
hold time of the data relative to the clock
setup time of the memory selection signal relative to the clock
hold time of the memory selection signal relative to the clock
setup time of the write permission signal relative to the clock
hold time of the write permission signal relative to the clock
input capacitance
dynamic power consumption in reading mode
dynamic power consumption in writing mode
dynamic power consumption in sleep mode
leakage current

Characterized parameters of OTP memories

access time
clock cycle time
the high clock time
the low clock time
output data switching time
setup time of the address signal relative to the clock
hold time of the address signal relative to clock
setup time of the memory selection signal relative to the clock
hold time of the memory selection signal relative to the clock
input capacitance
dynamic power consumption in reading mode
dynamic power consumption in sleep mode
leakage current

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