27 декабря 2016

RADIATION TOLERANCE MEASUREMENTS

Radiation tolerance tests of the digital library TI-RT-Lib018 (0.18 um technology) are successfully completed. The results of static and dynamic parameters control and functional control of microcircuits demonstrate that the library withstood functional testing and is characterized by high tolerance to radiation effects. No SEL or catastrophic failure occurred during all the tests up to a LET of 68.9 MeV·cm2/mg. 

TI-RT-Lib018 Radiation Tolerance Characteristics 

CharacteristicParameterValue
Total ionizing dose TID 800 krad
Dose rate DR 50-200 rad/s
SET immune SET threshold LET <6.5 MeV·cm2/mg [Si]
Cross-section at LET = 6.5 ÷ 68.9 MeV·cm2/mg [Si] 2.5·10-5 ÷ 5.3·10-5 cm2
SEU immune SEU threshold LET <6.5 MeV·cm2/mg [Si]
Cross-section at LET = 6.5 ÷ 68.9 MeV·cm2/mg [Si] 1.7·10-8 ÷ 2·10-7 cm2/bit
SEFI immune SEFI threshold LET <6.5 MeV·cm2/mg [Si]
Cross-section at LET = 6.5 ÷ 68.9 MeV·cm2/mg [Si] 4.7·10-8 ÷ 7.7·10-7 cm2
SEL immune No SEL occurred during all the tests up to a LET of 68.9 MeV·cm2/mg [Si]
Catastrophic failure immune No catastrophic failure occurred during all the tests up to a LET of 68.9 MeV·cm2/mg [Si]
Radiation tolerance characteristics Neutron Displacement Damage 5·1013 n/cm2
Dose Rate Survivability 1010 R/s
Electron fluence 2·10e/cm2
Proton fluence 2·10p/cm2